High Quality Test Pattern Generation and Boolean Satisfiability formatIsbn:Hardcover - 9781441999757 This conference aims to unify

This conference aims to unify theoretical and applied practitioners who use formal concept an- ysis

It is recommended that more detailed studies and analyses are done for different fields of applications before to jump to conclusions

Teilauf- Mengengerüst gabe pagatorisch wertmäßig ja ja a) b) ja ja nein* ja c) ja ja d) nein* ja e) f) nein* ja ja ja g) *Der Verbrauch dieser Faktoren setzt keine Ausgaben voraus

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High Quality Test Pattern Generation and Boolean Satisfiability formatIsbn:Hardcover - 9781441999757 This conference aims to unifyThis book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT based ATPG framework is presented which is also able to generate high quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and